Nanometrics Incorporated v. KLA-Tencor Corporation
Plaintiff: Nanometrics Incorporated
Defendant: KLA-Tencor Corporation
Case Number: 1:2011cv00685
Filed: August 3, 2011
Court: US District Court for the District of Delaware
Office: Wilmington Office
County: XX US, Outside State
Presiding Judge: Michael M. Baylson
Nature of Suit: Patent
Cause of Action: 35 U.S.C. ยง 271
Jury Demanded By: Plaintiff
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Plaintiff: Nanometrics Incorporated
Represented By: Mary B. Graham
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Defendant: KLA-Tencor Corporation
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